Sensors for Seismic and Low Vibrations

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Sensors for Seismic and Low Vibrations

Every application is different and requires a solution to fit based on size, performance and the environment. At Strainsense we have multiple technologies to match this need.

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Introduction

Every application is different and requires a solution to fit based on size, performance and the environment. At Strainsense we have multiple technologies to match this need.

Applications include:

  • Seismic
  • Seismology
  • Lithography Machines
  • Active floor vibration control
  • Position, Motion
  • Sway and Tilt control
  • Performance Vibration Control
  • Calibration laboratories

GA50 Embedded Sensing Element

The GA50 is a high performance open loop SiMEMS analogue output accelerometer available in various sensing ranges...

Standard ranges are 5g & 40g with custom solutions available in volume. The GA50 delivers unparalleled performance, capable of low residual noise <2 μg / √ Hz (VRW) and low short-term bias <100μg. The accelerometer is based on a bulk micro-machined silicon MEMS device and an ASIC with an analogue front end (AFE) and temperature sensor, assembled in a compact hermetically sealed LCC20 package.

Designed for integrated volume applications and PCB designs.

Features

  • Ranges ±5g, ±40g, ±70g
  • Differential voltage +/-2.4 VDC & Temp
  • Residual noise from 1.3μg / √Hz
  • Non-linearity: ±0.25% FS
  • Operating Temp: - 50 Deg C to 85 Deg C

Applications

  • Inertial Measurement Units (IMUs)
  • Other demanding guidance
  • Navigation
  • Autonomous
  • Seismic applications

JA-40GA Servo-Balanced Quartz Accelerometers

The JA-40GA is a high performance servo balanced quartz accelerometer for measuring very low levels of vibration. Servo balanced technology is class leading in terms of stability over temperature over time, essentially zero drift. The JA-40GA is available in ranges 2, 4 & 8g with residual noise 0.1 x 10-6 G/√ Hz max and Frequency response 200 Hz.

What is it used for?

Designed for moderate volume applications, some integration required. 

The JA-40GA accelerometer is therefore ideal for use in structural health monitoring, active vibration control systems, and earthquake observation, where even the slightest tremors can be indicative of catastrophe.

Features

  • Ultra-low noise
  • Excellent thermal stability
  • Low frequency operation
  • -20°C to +70°C operating temperature
  • Easy to install

EQ Series MEMs Capacitive Accelerometer

The Accelerometer EQ-series are based on proven MEMS technology and capacitive operating principle. The integrated electronic circuitry enables a differential analog voltage output (± 2.7 V FSO) and flexible power supply voltage from 5 to 40 VDC.

The sensors of the ASC EQ series feature an ultra-low noise level and achieve are solution of less than 1μg. They therefore fulfil the requirements of motion class B of seismic measurements.

The sensor ASC EQ-x211 feature alight weight aluminium housing and the sensors ASC EQ-x215 provide a robust stainless-steel housing, both with protection class IP65 and with detachable cable aswell as configurable length and connectors. The accelerometers are available in uniaxial, biaxial and triaxial configuration.

Designed for Test & Measurement applications, plug & play.

Features

  • ±3g and ±5g dynamic ranges
  • Frequency DC to 2000Hz
  • Built in Self Test option
  • Ultra Low Noise, Voltage output

Applications

  • Structural Health Monitoring
  • Seismic Sensing
  • Noise Measurements

KB12VD & KS48C IEPE Seismic Accelerometers

The KB12VD and KS48C are specifically designed IEPE Seismic Accelerometer for Vibration measurements and building vibrations, particularly at low frequencies not exceeding 0.6g.

The extremely sensitive piezo technology provides excellent resolution and lowest noise. KB12VD has a particularly highly sensitivity to mass ratio and features air damping for resonance attenuation and overload protection by friction coupling. KS48C is designed specifically with IP67 environment protection in mind. Sensitivity of 10000 mV/g to a maximum of 0.6g, ultra low noise 2 μg/√Hz @ 0.1Hz down to 0.1 μg/√Hz @ 10 Hz.

Designed for Test & Measurement applications, plug & play.

Features

  • Up to +/- 0.6 or 6g
  • 10,000/1000 mV/g output
  • -20 to 120 Deg C
  • Bend or Shear Designs

Applications

  • Suited for seismic measurement and building vibration
  • Vibration measurement at low frequencies
  • Extremely sensitive piezo system without amplification
  • Excellent resolution and lowest noise
  • Particularly good sensitivity-to-mass ratio
  • Air damping for resonance attenuation and overload protection by friction coupling

The vibration criteria VC-H through VC-M aren’t depicted in this table. These criteria are only recommended for evaluation, not for use as design criterion.

Curve Criterion

AMPLITUDE f µm/s (µin/s) DETAIL SIZE 2 µm

DESCRIPTION OF USE

Workshop (ISO)

800 (32,000) N/A

Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas

Office (ISO)

400 (16,000) N/A

Perceptible vibration. Appropriate to offices and non-sensitive areas

Residential Day (ISO)

200 (8,000) 75

Barely perceptible vibration. Appropriate to sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment and microscopes less than 40x.

Op. Theatre (ISO)

100 (4,000) 25

Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100X and for other equipment of low sensitivity.

VC-A

50 (2,000) 8

Adequate in most instances for optical microscopes to 400X, microbalances, optical balances, proximity and projection aligners, etc.

VC-B

25 (1,000) 3

Appropriate for inspection and lithography (including steppers) to 3µm line widths.

VC-C

12.5 (500) 1-3

Appropriate standard for optical microscopes to 1000X, inspection and lithography inspection equipment (inducing moderately sensitive electron microscopes) to 1µm detail size, TFT-LCD stepper/scanner processes.

VC-D

6.25 (250) 0.1 - 0.3

Suitable in most instances for the most demanding equipment including electron microscopes (TEMs and SEMs) and E-Beam systems.

VC-E

3.12 (125) < 0.1

A challenging criterion to achieve. Assumed to be adequate for the most demanding of sensitive systems including long path, laser-based, small target systems, E-Beam lithography systems working at nanometer scales, and other systems requiring extraordinary dynamic stability.

VC-F

1.56 (62.5) N/A

Appropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.

VC-G

.78 (31.3) N/A

Appropriate for extremely quiet research spaces; generally difficult to achieve in most instances, especially cleanrooms. Not recommended for use as a design criterion, only for evaluation.

NIST-A

   

NIST-A criterion is idential to the VC-E curve at frequencies above 20 Hz, but maintains constant displacement at frequencies below this. 0.025µm or 25nm between 1 and 20Hz; 3.1µm/s (125µ in/s) between 20 and 100Hz

Contact our sales engineers to talk more about your application needs here.

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